X-RAY INSPECTION MACHINE / COMPUTED TOMOGRAPHY / MEASUREMENT XT H 225

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X-RAY INSPECTION MACHINE / COMPUTED TOMOGRAPHY / MEASUREMENT XT H 225

The passage level XT H 160 and the adaptable XT H 225 frameworks offer a microfocus X-beam source, an enormous investigation volume, high picture goals and is prepared for ultrafast CT recreation.

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Description

The passage level XT H 160 and the adaptable XT H 225 frameworks offer a microfocus X-beam source, an enormous investigation volume, high picture goals and is prepared for ultrafast CT recreation. They spread a wide scope of uses, including the review of plastic parts, little castings and complex systems just as investigating materials and characteristic examples.

Advantages

Restrictive 225 kV microfocus X-beam source with 3 µm central spot size
Simple framework activity and ease of-possession
Shocking pictures giving extraordinary knowledge
Elite picture obtaining and volume handling
Direct investigation computerization
Wellbeing first

Specification

Additional information

Technology

computed tomography, x-ray

Other Characteristics

measurement

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